13 results
Three-Dimensional Electron Energy Deposition Modeling of Cathodoluminescence Emission near Threading Dislocations in GaN and Electron-Beam Lithography Exposure Parameters for a PMMA Resist
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 6 / December 2012
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- 12 November 2012, pp. 1220-1228
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- December 2012
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Chemical Vapor Deposition of Porous GaN Particles on Silicon
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- Microscopy and Microanalysis / Volume 18 / Issue 4 / August 2012
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- 26 July 2012, pp. 905-911
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- August 2012
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The Probe Profile and Lateral Resolution of Scanning Transmission Electron Microscopy of Thick Specimens
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- Microscopy and Microanalysis / Volume 18 / Issue 3 / June 2012
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- 08 May 2012, pp. 582-590
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- June 2012
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Time Voltage Dependency in Resistance Switching TiO2
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- MRS Online Proceedings Library Archive / Volume 1430 / 2012
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- 21 May 2012, mrss12-1430-e09-03
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- 2012
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A Nanodamascene Process to be used as a Building Block for Nanodevices
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- MRS Online Proceedings Library Archive / Volume 961 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0961-O10-07
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- 2006
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The Impact of Charging on Low-Energy Electron Beam Lithography
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- Microscopy and Microanalysis / Volume 10 / Issue 6 / December 2004
- Published online by Cambridge University Press:
- 01 December 2004, pp. 804-809
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- December 2004
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Electron Range at Low Energy (Eo < 10 KEV): Atomic Number Dependant ?
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 704-705
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- August 2002
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Study of self-assembled InAs quantum dots on InP nano-templates by low voltage scanning electron microscopy cathodoluminescence
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 712-713
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- August 2002
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ESEM Beam Current Measuring Device based on a Planar Schottky Diode
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 1538-1539
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- August 2002
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Characterization of Phase Transformation by Fe-SEM and Fe-TEM Analysis
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 490-491
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- August 2001
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'Secondary’ Electron Detector Design and Positioning in the Variable Pressure Scanning Electron Microscope: The Colour Option
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 772-773
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- August 2000
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Advances in Environmental Scanning Electron Microscopy: Semiconductor/Thin Fim Applications, Cathodoluminescence (CL) Spectroscopy, and Detector Quantum Efficiency (DQE) Comparisons.
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 278-279
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- August 1999
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Parametrization of The Range of Electron At Low Energy (Eo < 10 Kev) Using The Casino Monte Carlo Program
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 885-886
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- August 1997
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